DocumentCode
19868
Title
Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications
Author
Sabena, D. ; Sterpone, L. ; Carro, Luigi ; Rech, P.
Author_Institution
Dipt. di Autom. e Inf. (DAUIN), Politec. di Torino, Turin, Italy
Volume
61
Issue
6
fYear
2014
fDate
Dec. 2014
Firstpage
3123
Lastpage
3129
Abstract
Thanks to the capability of efficiently executing massive computations in parallel, general purpose graphic processing units (GPGPUs) have begun to be preferred to CPUs for several parallel applications in different domains. Two are the most relevant fields in which, recently, GPGPUs have begun to be employed: high performance computing (HPC) and embedded systems. The reliability requirements are different in these two applications domain. In order to be employed in safety-critical applications, GPGPUs for embedded systems must be qualified as reliable. In this paper, we analyze through neutron irradiation typical parallel algorithms for embedded GPGPUs and we evaluate their reliability. We analyze how caches and threads distributions affect the GPGPU reliability. The data have been acquired through neutron test experiments, performed at the VESUVIO neutron facility at ISIS. The obtained experimental results show that, if the L1 cache of the considered GPGPU is disabled, the algorithm execution is most reliable. Moreover, it is demonstrated that during a FFT execution most errors appear in the stages in which the GPGPU is completely loaded as the number of instantiated parallel tasks is higher.
Keywords
cache storage; embedded systems; fast Fourier transforms; general purpose computers; graphics processing units; parallel processing; safety-critical software; FFT; HPC; ISIS; VESUVIO neutron facility; caches distributions; embedded GPGPU; embedded systems; general purpose graphic processing units; high performance computing; neutron irradiation; parallel applications; safety critical applications; threads distributions; Aerospace electronics; Algorithm design and analysis; Embedded systems; Graphics processing units; Neutrons; Parallel algorithms; Reliability; General purpose graphic processing units (GPGPUs); radiation testing; single-event effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2014.2363358
Filename
6940324
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