• DocumentCode
    1987495
  • Title

    RF noise modelling of 0.25 /spl mu/m CMOS and low power LNAs

  • Author

    Vanoppen, R.R.J. ; de Maaijer, L.M.F. ; Klaassen, D.B.M. ; Tiemeijer, L.F.

  • Author_Institution
    Philips Res. Lab., Eindhoven, Netherlands
  • fYear
    1997
  • fDate
    10-10 Dec. 1997
  • Firstpage
    317
  • Lastpage
    320
  • Abstract
    A prototype 0.5 /spl mu/m CMOS LNA with a noise figure of 2.2 dB and a gain of 16.9 dB at 900 MHz at a power consumption of 1.8 mW is reported. This result, and the noise figures obtained on 0.25 /spl mu/m CMOS, are reproduced by simulations, confirming that RF noise modeling can be accurately performed using our public domain MOS Model 9. Simulations are presented for similar LNAs realized in standard CMOS processes with gate dimensions down to 0.13 /spl mu/m. Provided high Q matching circuitry is used, for the latter gate length a noise figure of only 1.1 dB and 27 dB gain at 1800 MHz, at a minimal power consumption of only 0.2 mW, is predicted.
  • Keywords
    CMOS analogue integrated circuits; integrated circuit modelling; integrated circuit noise; radiofrequency amplifiers; 0.13 micron; 0.25 micron; 0.5 micron; 1.1 dB; 16.9 dB; 1800 MHz; 2.2 dB; 27 dB; 900 MHz; CMOS IC; MOS Model 9; RF noise model; gain; high Q matching circuitry; low power LNA; noise figure; power consumption; simulation; Circuit simulation; Circuit testing; Frequency measurement; Integrated circuit noise; MOS devices; Noise figure; Noise measurement; Power measurement; Radio frequency; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4100-7
  • Type

    conf

  • DOI
    10.1109/IEDM.1997.650390
  • Filename
    650390