DocumentCode :
1988111
Title :
Design and Measurement of Frequency Selective Surfaces
Author :
Bielli, P. ; Contu, S. ; Savini, D. ; Saitto, A. ; Tascone, R.
fYear :
1983
fDate :
3-8 Sept. 1983
Firstpage :
771
Lastpage :
777
Abstract :
A new method for dimensioning a multiple layer Frequency Selective Surface (F.S.S.) based on an appropriate electromagnetic model will be examined. Feasibility and performance I imitations of F.S.S. having a single grid of Jerusalem crosses packed with several dielectric slabs will be analyzed. The technique of waveguide simulators is proposed as an attractive alternative to the radiation measurement technique. Experimental and theoretical results, in the frequency range of 8÷18Qk, are discussed in order to point out: the val idity of the measurement technique and the accuracy of the electromagnetic model.
Keywords :
Admittance; Circuits; Dielectrics; Electromagnetic modeling; Electromagnetic scattering; Frequency measurement; Frequency selective surfaces; Measurement techniques; Reflection; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1983. 13th European
Conference_Location :
Nurnberg, Germany
Type :
conf
DOI :
10.1109/EUMA.1983.333192
Filename :
4131984
Link To Document :
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