Title :
NUC algorithm based on Kalman Filter for improvement in detector offset and gain drift
Author_Institution :
Dept. of Electron. & Commun. Eng., Dehradun Inst. of Technol., Dehradun, India
Abstract :
Infrared Focal Plane Arrays (IRFPA) imaging system has some advantages, such as simple structure, good reliability, high detecting sensitivity and high system operating frame frequency as compared to other Thermal Imaging System. IRFPA devices also have their intrinsic shortcoming, e.g. response non-uniformity of the IRFPA, which is a key technology that must be resolved in its application. The non-uniformity of IRFPA behaves as fixed pattern noise on the images. This deteriorates the temperature resolution of the infrared imaging systems seriously, so nearly all IRFPA devices applied in engineering must be adopted a corresponding NUC technology. NUC Algorithm based on Kalman Filter for improvement in detector offset and gain drift is proposed in this paper. It utilizes the information in the foregone frame block and the current frame block to refresh the estimation of gain and offset parameter in optimization. It overcomes the effect that the nonlinear response of IRFPA detector has on the non-uniformity correction accuracy. Experimental results proved that the presented algorithm resolves the problems of detector offset and gain drifting, nonlinear response and corrected the non-uniformity.
Keywords :
Kalman filters; focal planes; infrared detectors; Kalman filter; NUC algorithm; detector offset drift; fixed pattern noise; frame block; gain drift; infrared focal plane arrays imaging system; temperature resolution; Additive noise; Covariance matrix; Equations; Filtering algorithms; Gaussian processes; Infrared detectors; Infrared imaging; Optical imaging; Photonics; Reliability engineering; Detector Offset; Gain Drift; Kalman Filter; NUC;
Conference_Titel :
Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
Conference_Location :
Varanasi
Print_ISBN :
978-1-4244-4846-3
DOI :
10.1109/ELECTRO.2009.5441155