Title :
Prediction of radiation resistance of CMOS integrated microcircuits
Author :
Korshunov, F.P. ; Bogatyrev, Yu.V. ; Belous, A.I. ; Shwedov, G.V. ; Lastovsky, S.B. ; Karas, V.I. ; Kulgachev, V.I.
Author_Institution :
Sci.-Practical Mater. Res. Centre, NAS of Belarus, Minsk, Belarus
Abstract :
The results of experimental researches and the calculating-experimental method of prediction of radiation resistance of logic CMOS integrated microcircuits at influence of fast electrons are submitted.
Keywords :
CMOS logic circuits; electron beam effects; fast electron effects; logic CMOS integrated microcircuits; radiation resistance; CMOS integrated circuits; Electrons; Helium; IEEE catalog; MOSFET circuits; Organizing;
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
