Flicker noise measurement of HF quartz resonators

Author

Groslambert, J. ; Giordano, V. ; Brunet, M. ; Rubiola, E.

Author_Institution

Lab. de Phys. et Metrol. des Oscillateurs, CNRS, Besancon, France

Volume

2

fYear

1999

fDate

1999

Firstpage

1172

Abstract

The frequency flicker of quartz resonators can be derived from the measurement of S_φ(f), i.e. the power spectrum density of phase fluctuations φ. Besides, the interferometric method turns out to be the best choice to measure the quartz resonator phase fluctuations because of its high sensitivity even in the low power conditions required for these devices. Combining these two ideas, we built an instrument suitable to measure the resonator frequency flicker floor and we measured the stability of some 10 MHz high performances resonators as a function of the dissipated power. The stability limit of our instrument, described in terms of Allan deviation σ_y(τ), is of some 10^-14

Keywords

crystal resonators; electric noise measurement; electromagnetic wave interferometry; flicker noise; frequency stability; 10 MHz; Allan deviation; HF quartz resonators; dissipated power; flicker noise measurement; interferometric method; phase fluctuations; power spectrum density; resonator frequency flicker floor; stability; stability limit; 1f noise; Fluctuations; Frequency measurement; Hafnium; Instruments; Noise measurement; Phase measurement; Power measurement; Resonant frequency; Stability;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European

Conference_Location

Besancon

ISSN

1075-6787

Print_ISBN

0-7803-5400-1

Type

conf

DOI

10.1109/FREQ.1999.841549

Filename

841549