DocumentCode
1989799
Title
A New Type and Facile Measuring System of Soil Roughness
Author
Haiping, Lu ; Chunliang, Xu ; Mingquan, Jia ; Yan, Chen
Author_Institution
Sch. of Phys. Electron., UESTC, Chengdu
Volume
2
fYear
2008
fDate
21-22 Dec. 2008
Firstpage
115
Lastpage
118
Abstract
A practical and convenient system is put forward in this paper to obtain the roughness parameter of soil surface profile correctly. Its composing, workflow were introduced, the feasibility was demonstrated, and the calculated data was analyzed. After theoretical analysis and verification, the system was proved to performance good, and can calculate the roughness parameters of samples accurately.
Keywords
microwave measurement; remote sensing; soil; facile measuring system; microwave backscattering; remote sensing; soil roughness; soil surface profile; Backscatter; Cameras; Instruments; Needles; Rough surfaces; Sampling methods; Scattering; Soil measurements; Steel; Surface roughness; correlation length; soil roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Education Technology and Training, 2008. and 2008 International Workshop on Geoscience and Remote Sensing. ETT and GRS 2008. International Workshop on
Conference_Location
Shanghai
Print_ISBN
978-0-7695-3563-0
Type
conf
DOI
10.1109/ETTandGRS.2008.116
Filename
5070321
Link To Document