• DocumentCode
    1991644
  • Title

    On microprocessor error behavior modeling

  • Author

    Rimen, M. ; Ohlsson, J. ; Torin, J.

  • Author_Institution
    Lab. for Dependable Computing, Chalmers Univ. of Technol., Goteborg, Sweden
  • fYear
    1994
  • fDate
    15-17 June 1994
  • Firstpage
    76
  • Lastpage
    85
  • Abstract
    A microprocessor error behavior function (EBF) is introduced, mapping faults into errors on the functional level. The errors are obtained using a functional model of the processor. By applying the EBF to a fault and instruction distribution, it is possible to obtain the corresponding error distribution. A case study is described, in which (i) the EBFs for simulated bit-flip and pin-level faults are designed and used to compare the bit-flip and pin-level fault models, and (ii) the obtained error distribution for the bit-flip faults is used in an error injection experiment on the functional level to emulate these faults. For the processor used in the case study, it was found that only 9-12% of the bit-flip faults could be emulated using pin-level faults, while a tentative evaluation of the possibility to emulate bit-flip faults with software-implemented fault injection showed that 98-99% could be emulated. Finally, the results of the emulated bit-flip errors corresponded well to the real results obtained using bit-flip faults, thus indicating that the injected errors are good approximations of the faults.<>
  • Keywords
    computer testing; fault location; integrated circuit testing; microprocessor chips; bit-flip errors; bit-flip faults; error distribution; instruction distribution; microprocessor error behavior modeling; pin-level faults; Application software; Circuit faults; Computational modeling; Computer errors; Computer simulation; Fault detection; Fault tolerant systems; Laboratories; Microprocessors; Process design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1994. FTCS-24. Digest of Papers., Twenty-Fourth International Symposium on
  • Conference_Location
    Austin, TX, USA
  • Print_ISBN
    0-8186-5520-8
  • Type

    conf

  • DOI
    10.1109/FTCS.1994.315655
  • Filename
    315655