• DocumentCode
    1992168
  • Title

    An Improved Image Segmentation Method Based on Fast Level Set Combining with C-V Model

  • Author

    Xu, Dong ; Peng, Zhenming ; Yong, Yang

  • Author_Institution
    Sch. of Opto-Electron. Inf., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2012
  • fDate
    27-30 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Aim at the high computational complexity of level set methods has excluded themselves from many real-time applications. An improved image segmentation method using the fast level set algorithm is proposed in this paper. The algorithm adopts improved fast level set base on single list to realize the curve evolution, which simplifies the fast level set method. Avoiding the traditional level set methods need to re-initialize the level set function and the processes of solving partial differential equations, accelerating the velocity of segmentation. And the algorithm uses the binary fitting terms of C-V model to design the speed function of curve evolution, it preserves the global optimization characteristic of C-V model. In addition, a termination criterion based on the number change of contour points in the single list is proposed to ensure that the evolving curve can automatically stop on the true boundaries of objects. The experiments show that the algorithm which is proposed in this paper can significantly improve the segmentation velocity and efficiently segment the noise images.
  • Keywords
    computational complexity; image segmentation; optimisation; partial differential equations; C-V model; binary fitting terms; computational complexity; contour points; curve evolution speed function; fast level set method; global optimization characteristic; image segmentation method; partial differential equations; segmentation velocity; termination criterion; Algorithm design and analysis; Capacitance-voltage characteristics; Computational modeling; Image segmentation; Level set; Mathematical model; Noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering and Technology (S-CET), 2012 Spring Congress on
  • Conference_Location
    Xian
  • Print_ISBN
    978-1-4577-1965-3
  • Type

    conf

  • DOI
    10.1109/SCET.2012.6342107
  • Filename
    6342107