Study of manufacturing variations impact on TID-ATREEs synergistic effect in LM124 operational amplifier

Author

Roig, Fabien ; Dusseau, L. ; Ribeiro, P. ; Auriel, G. ; Roche, Nicholas J.-H ; Privat, A. ; Vaille, J.-R. ; Boch, J. ; Saigne, F. ; Marec, R. ; Calvel, P. ; Bezerra, F. ; Ecoffet, R. ; Azais, Bruno

Author_Institution

Commissariat a l´Energie Atomique et aux Energies Alternatives, Gramat, France

fYear

2013

fDate

23-27 Sept. 2013

Firstpage

1

Lastpage

4

Abstract

The impact of different manufacturing process and designs on the TID-ATREEs synergistic effect is investigated in the LM124 operational amplifier (opamp) from three different manufacturers. Significant variations were observed on both the Total Ionizing Dose (TID) sensitivity and the Analog Transient Effects on Electronics Effects (ATREE) responses of LM124 devices from different manufacturer. The ATREEs are produced by high dose-rate X-ray pulses using a flash X-ray facility. ATREE modeling results were performed using a previously developed simulation tool.

Keywords

X-ray effects; operational amplifiers; transients; LM124 opamp; LM124 operational amplifier; TID-ATREEs synergistic effect; analog transient effects; dose rate X-ray pulse; flash X-ray facility; manufacturing variation; total ionizing dose sensitivity; Integrated circuit modeling; Operational amplifiers; Predictive models; Radiation effects; Sensitivity; Shape; Transient analysis; Bipolar analog integrated circuits; X-ray effects; circuit modeling; ionizing dose; transient response;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on

Conference_Location

Oxford

Type

conf

DOI

10.1109/RADECS.2013.6937386

Filename

6937386