• DocumentCode
    1992244
  • Title

    Investigating the impact of propagation paths and re-convergent paths on the propagation induced pulse broadening

  • Author

    Hamad, Ghaith Bany ; Hasan, Syed Rafay ; Mohamed, O. Ait ; Savaria, Yvon

  • Author_Institution
    Groupe de Rech. en Microelectron. et Microsystemes, Polytech. Montreal, Montréal, QC, Canada
  • fYear
    2013
  • fDate
    23-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new investigation of the dependence of the Single Event Transient (SET) pulse broadening on the input pattern i.e. fan-in, propagation paths, pulse polarity and re-convergent paths is presented. Worst and best SET pulse propagation paths are identified.
  • Keywords
    radiation hardening (electronics); SET pulse propagation paths; fan-in; propagation induced pulse broadening; pulse polarity; re-convergent paths; single event transient pulse broadening; Analytical models; Attenuation; CMOS integrated circuits; Integrated circuit modeling; Logic gates; Semiconductor device modeling; Single event transients; Broadening; Input pattern; PIPB; SET; Soft error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
  • Conference_Location
    Oxford
  • Type

    conf

  • DOI
    10.1109/RADECS.2013.6937387
  • Filename
    6937387
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1992244