Linear integrated circuit cumulated dose test representativeness for high energy electron environment applications

Linear electronic device radiation hardness is a major constraint for space application design. The part robustness to cumulated dose is evaluated thanks to ionizing dose deposition and displacement damage. When those effects are studied separately, the ionizing dose degradation is usually measured under ⁶⁰Co gamma irradiation, whereas the displacement damage contribution is estimated under neutron environment. The ⁶⁰Co irradiation deposits an ionizing dose with no displacement damage, and on the contrary neutron irradiation creates displacement damage but negligible ionizing dose deposition. Nevertheless, a linear device placed in a particular environment, high energy electrons for example, is simultaneously submitted to both ionizing and non-ionizing dose effects. The aim of the test sequences and measurements presented in this document is to compare the representativeness of usual cumulated dose test procedures versus real high energy electron irradiation effects.