Mitigation of single-event charge sharing in a commercial FPGA architecture

Author

Kelly, Andrew T. ; Alles, Michael L. ; Ball, D.R. ; Massengill, Lloyd W. ; Ramaswamy, Srini ; Haddad, Nadim F. ; Brown, Ronald D. ; Fleming, Patrick R. ; Chan, Erwin Hoi Wing ; Ekanayake, Virantha ; Kelly, Clinton W. ; Pelosi, Christopher ; McMorrow, Dale

Author_Institution

BAE Syst., Manassas, VA, USA

fYear

2013

fDate

23-27 Sept. 2013

Firstpage

1

Lastpage

8

Abstract

The motivation for single event effects (SEE) analysis and mitigation as part of the process for adaptation of a commercial Field Programmable Gate Array (FPGA) architecture for space-qualified applications is discussed. The interdependent roles of heavy-ion and laser-induced upset evaluation coupled with computer-aided investigations of SEE mechanisms and mitigation techniques in this process are shown to enable a significant reduction in SEE sensitivity of the device, while achieving minimal impact on remanufacturing steps.

Keywords

field programmable gate arrays; radiation hardening (electronics); FPGA architecture; SEE analysis; SEE mitigation; field programmable gate array architecture; heavy-ion; laser-induced upset evaluation; mitigation techniques; single event effects analysis; single-event charge; Arrays; Field programmable gate arrays; Performance evaluation; Radiation detectors; Shift registers; System recovery; Testing; RHFGPA; Single event effects; charge sharing; radiation hardening by design;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on

Conference_Location

Oxford

Type

conf

DOI

10.1109/RADECS.2013.6937410

Filename

6937410