SEU monitoring in mixed-field radiation environments of particle accelerators

Author

Tsiligiannis, G. ; Dilillo, L. ; Bosio, A. ; Girard, P. ; Pravossoudovitch, S. ; Todri, A. ; Virazel, A. ; Mekki, J. ; Brugger, M. ; Wrobel, F. ; Saigne, F.

Author_Institution

Lab. d´Inf., de Robot. et de Microelectron. de Montpellier (LIRMM), Univ. de Montpellier II, Montpellier, France

fYear

2013

fDate

23-27 Sept. 2013

Firstpage

1

Lastpage

4

Abstract

CERN hosts a large number of electronic devices and equipment, used over its different particle accelerators. In certain areas, they are operating in harsh radiation environments. In order to assure their proper functionality, they undergo several tests in experimental test areas, while specialized monitors constantly record the respective radiation levels. The H4IRRAD experimental test area has been specifically designed to reproduce the radiation field test that is present within the LHC tunnel and shielded areas. It has been used to test our custom SRAM based monitors. The monitors have been exposed to a dose and a high energy hadron fluence of about 76 Gy and 1.3×10¹¹ cm^-2 respectively. The results show that the total ionizing dose (TID) effect does not impact the bit cross section of our devices. Moreover the Single Event occurrence is coherent to the beam intensity fluctuations, proving that these devices are appropriate for SEU monitoring under mixed particle fields.

Keywords

SRAM chips; integrated circuit testing; particle accelerators; radiation hardening (electronics); H4IRRAD experimental test area; LHC tunnel; SEU monitoring; TID; custom SRAM based monitors; electronic devices; harsh radiation environments; high energy hadron fluence; mixed particle fields; mixed-field radiation environments; particle accelerators; radiation field test; radiation levels; single event occurrence; single event upset; total ionizing dose effect; Monitoring; Neutrons; Particle beams; Protons; Random access memory; Single event upsets; Testing; H4IRRAD; Particle accelerators; RadMon; SEU; SRAM; mixed particle fields; monitor;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on

Conference_Location

Oxford

Type

conf

DOI

10.1109/RADECS.2013.6937419

Filename

6937419