• DocumentCode
    1993716
  • Title

    The estimation of long time operation bipolar devices in space environment using conversion model of ELDRS

  • Author

    Pershenkov, V.S. ; Bakerenkov, A.S. ; Solomatin, A.V. ; Belyakov, V.V.

  • Author_Institution
    Moscow Eng. Phys. Inst., Moscow, Russia
  • fYear
    2013
  • fDate
    23-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    On base of the proposed conversion model, the radiation degradation of LM111 comparator input current is considered during dose rate variation corresponding 12 hour orbit, cyclic device temperature variation and impact of solar flare during space mission.
  • Keywords
    bipolar transistors; comparators (circuits); radiation hardening (electronics); solar flares; ELDRS; LM111 comparator input current; conversion model; long time operation bipolar devices; radiation degradation; solar flare; space environment; space mission; Annealing; Degradation; Electron traps; Estimation; Radiation effects; Space vehicles; Temperature; ELDRS; comparator; conversion model; interface trap;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
  • Conference_Location
    Oxford
  • Type

    conf

  • DOI
    10.1109/RADECS.2013.6937456
  • Filename
    6937456
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1993716