• DocumentCode
    1994615
  • Title

    Pro-VIZOR: Process tunable virtually zero margin low power adaptive RF for wireless systems

  • Author

    Sen, Shreyas ; Natarajan, Vishwanath ; Senguttuvan, Rajarajan ; Chatterjee, Abhijit

  • Author_Institution
    Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    492
  • Lastpage
    497
  • Abstract
    In this paper, a process tunable, continuously adaptive wireless front end architecture and related adaptation algorithms are presented that allow an RF transceiver to function at minimum power irrespective of channel conditions and process variability induced performance loss in the RF front end and baseband interface. Current wireless transceiver front ends are designed for worst case channel conditions and a limited degree of post manufacture tuning is performed to compensate for process variations. It is shown how the proposed architecture can result in significant power savings over current practice without compromising system-level bit error rate. The adaptation methodology is applied to a WLAN transceiver design and hardware measurement data for an adaptive receiver is presented.
  • Keywords
    adaptive systems; error statistics; telecommunication power supplies; transceivers; wireless LAN; wireless channels; Pro-VIZOR; RF transceiver; WLAN transceiver design; adaptation algorithms; adaptive receiver; baseband interface; continuously adaptive wireless front end architecture; hardware measurement data; process tunable virtually zero margin low power adaptive RF; process variability induced performance loss; system-level bit error rate; wireless systems; worst case channel conditions; Baseband; Bit error rate; Energy consumption; Hardware; Management training; Manufacturing processes; Radio frequency; Radio transmitters; Transceivers; Tunable circuits and devices; Low Power RF transceivers; Process tolerant Adaptive RF;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555867