• DocumentCode
    1994907
  • Title

    Real-Time Supply Voltage Sensor for Detecting/Debugging Electrical Timing Failures

  • Author

    Ueno, Masahiro ; Hashimoto, Mime ; Onoye, Takao

  • Author_Institution
    Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
  • fYear
    2013
  • fDate
    20-24 May 2013
  • Firstpage
    301
  • Lastpage
    305
  • Abstract
    Debugging electrical timing bugs consumes a significant portion of validation efforts. The main cause of this problem is that electrical bugs appear as one-cycle bit-flips under only a certain operating condition such as voltage, temperature and frequency. In addition, run-time detection of a suspicious electrical bug is drawing attention for enabling voltage over-scaling and/or ensuring reliable operations. In this work, we focus on power supply noise as a primary cause of electrical bugs and propose a supply voltage sensor which achieves one-shot and every-cycle sensing. The proposed sensor can provide cycle-accurate voltage variation for detecting and debugging electrical bugs. The performance of the sensor is evaluated on an FPGA, and the measured voltage resolution is 29mV. An observed correlation between sensing results and a processor failure suggests the utility of the proposed sensor for debugging.
  • Keywords
    electric sensing devices; field programmable gate arrays; logic design; power supply circuits; FPGA; cycle-accurate voltage variation; electrical timing bugs; every-cycle sensing; one-cycle bit-flips; one-shot sensing; operating condition; power supply noise; processor failure; reliable operations; run-time detection; validation efforts; voltage 29 mV; voltage over-scaling; voltage resolution; Clocks; Debugging; Delays; Field programmable gate arrays; Noise; Voltage measurement; electrical bug; post-silicon debug; post-silicon validation; supply noise sensor; time-to-digital converter; timing failure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2013 IEEE 27th International
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    978-0-7695-4979-8
  • Type

    conf

  • DOI
    10.1109/IPDPSW.2013.126
  • Filename
    6650900