• DocumentCode
    1996274
  • Title

    Boosted readout for CMOS APS pixels

  • Author

    Ay, Suat U.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Idaho, Moscow, ID, USA
  • fYear
    2011
  • fDate
    15-18 May 2011
  • Firstpage
    2205
  • Lastpage
    2208
  • Abstract
    In order to reduce power consumption and improve low-voltage operation capability of standard three transistor (3T) CMOS active pixel sensor (APS), new pixel readout is proposed utilizing supply boosting technique (SBT). Pixel supply voltage as well as reset and select signals for APS pixel are boosted to achieve wider and extended linear operating range in a standard CMOS process with high-Vt transistors. Reset and supply boosting was used for extending dynamic range of the pixel source follower (PSF) amplifier, while the select signal boosting was utilized for linearizing transfer characteristics of the PSF. Extension of PSF dynamic range using reset, select, and supply boosting (RSSB) resulted in operation of 3T APS pixel at 1.2V supply with 150mV dynamic range even though the threshold of the NMOS device was 0.8V. Proposed method does not degrade the device reliability margins and use single supply input.
  • Keywords
    CMOS analogue integrated circuits; CMOS image sensors; amplifiers; low-power electronics; readout electronics; semiconductor device reliability; CMOS APS pixel; CMOS active pixel sensor; NMOS device threshold; PSF dynamic; boosted readout; device reliability margin; high-Vt transistor; linear operating range; low voltage operation capability; pixel readout; pixel source follower amplifier; pixel supply voltage; power consumption; signal boosting; standard CMOS process; standard three transistor; supply boosting technique; transfer characteristics; voltage 0.8 V; voltage 1.2 V; voltage 150 mV; Boosting; CMOS integrated circuits; CMOS technology; Dynamic range; Pixel; Threshold voltage; Transistors; CMOS APS; image sensors; low-power; low-voltage; supply boosting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4244-9473-6
  • Electronic_ISBN
    0271-4302
  • Type

    conf

  • DOI
    10.1109/ISCAS.2011.5938038
  • Filename
    5938038