DocumentCode
1996754
Title
Visualization of negative refraction in phononic crystal using pulsed light source
Author
Nishimiya, Kojiro ; Ohbuchi, Takeshi ; Wakatsuki, Naoto ; Mizutani, Koichi ; Yamamoto, Ken
Author_Institution
Grad. Sch. of Syst. & Inf. Eng., Univ. of Tsukuba, Tsukuba, Japan
fYear
2009
fDate
20-23 Sept. 2009
Firstpage
1545
Lastpage
1547
Abstract
In recent years, the phononic crystal gets a lot attention because the size of phononic crystal is larger than that of photonic crystal for the relation between the wavelength of sound and that of light. Phononic crystal has many characteristics. Among them, we regard the negative refraction in phononic crystal. The negative refraction has a potential for the application to acoustical flat lens. We visualize the negative refraction by using optical method. In addition, the phononic crystals are made by self-produced. Therefore, they have some deviances of lattices in the crystals. We verified the influence depending on the deviances of lattices by using finite element method (FEM). As results, it is verified that the deviance of lattice have an influence on the behavior of wave propagation in phononic crystals. The behaviors are very different depending on the position of deviation of lattice. Also, we consider that it has possibilities of more effective focus method for the acoustical flat lens using the influence of deviances in a positive way.
Keywords
acoustic devices; acoustic imaging; acoustic materials; crystal structure; finite element analysis; phononic crystals; wave propagation; acoustical flat lens; crystal lattices; finite element method; negative refraction visualization; phononic crystal; pulsed light source; wave propagation; Acoustic refraction; Lattices; Lenses; Light sources; Optical diffraction; Optical propagation; Optical refraction; Photonic crystals; Steel; Visualization; Fresnel diffraction; Visualization; component; negative refraction; phononic crystal;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location
Rome
ISSN
1948-5719
Print_ISBN
978-1-4244-4389-5
Electronic_ISBN
1948-5719
Type
conf
DOI
10.1109/ULTSYM.2009.5441656
Filename
5441656
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