• DocumentCode
    1996904
  • Title

    Enhanced TED MMW Device Performance using Graded Doping Profiles

  • Author

    Ondria, John ; Ross, Raymond L.

  • Author_Institution
    Marconi Electronic Devices Ltd., Lincoln, UK
  • fYear
    1987
  • fDate
    7-11 Sept. 1987
  • Firstpage
    673
  • Lastpage
    680
  • Abstract
    Epitaxially grown GaAs transferred electron device n++n n+ structures, having intentionally graded n-active layer doping concentrations, exhibit significant improvements in output powers and efficiencies relative to flat n-active layer devices. A further improvement of greater than 30 percent results for devices designed to operate in the heat sink - anode configuration. state-of-the-art rf performance results are presented here along with accelerated life test date: oscillators operating continuously (cw) at 110°C near 61GHz in the second harmonic mode have exhibited essentially constant rf and dc performance after 10,000 hours of operation. Extrapolation to +85°C corresponds to 50,000 hours (5.7 years).
  • Keywords
    Anodes; Doping profiles; Extrapolation; Gallium arsenide; Gunn devices; Heat sinks; Life estimation; Life testing; Oscillators; Power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1987. 17th European
  • Conference_Location
    Rome, Italy
  • Type

    conf

  • DOI
    10.1109/EUMA.1987.333684
  • Filename
    4132418