DocumentCode
1996904
Title
Enhanced TED MMW Device Performance using Graded Doping Profiles
Author
Ondria, John ; Ross, Raymond L.
Author_Institution
Marconi Electronic Devices Ltd., Lincoln, UK
fYear
1987
fDate
7-11 Sept. 1987
Firstpage
673
Lastpage
680
Abstract
Epitaxially grown GaAs transferred electron device n++n n+ structures, having intentionally graded n-active layer doping concentrations, exhibit significant improvements in output powers and efficiencies relative to flat n-active layer devices. A further improvement of greater than 30 percent results for devices designed to operate in the heat sink - anode configuration. state-of-the-art rf performance results are presented here along with accelerated life test date: oscillators operating continuously (cw) at 110°C near 61GHz in the second harmonic mode have exhibited essentially constant rf and dc performance after 10,000 hours of operation. Extrapolation to +85°C corresponds to 50,000 hours (5.7 years).
Keywords
Anodes; Doping profiles; Extrapolation; Gallium arsenide; Gunn devices; Heat sinks; Life estimation; Life testing; Oscillators; Power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1987. 17th European
Conference_Location
Rome, Italy
Type
conf
DOI
10.1109/EUMA.1987.333684
Filename
4132418
Link To Document