Title :
Analysis of Electro-Optic Modulators by the Method of Lines
Author :
Keen, A.G. ; Wale, M.J. ; Sobhy, M.I. ; Holden, A.J.
Author_Institution :
Electronic Engineering Laboratories, University of Kent Canterbury, CT2 7NT, UK
Abstract :
The method of lines has been applied to the calculation of electric field distributions within integrated optical modulators employing coplanar electrode structures. The method is efficient and permits the accurate modelling of multi-layer structures with varying anisotropy and multiple electrodes, such as are encountered in practical integrated optical devices. Calculated values for the induced optical phase shift in a test device are in good agreement with experimental results. A quasi-TEM calculation has been employed in the present case; it is however a feature of the method that extension to a full-wave analysis of dominant modes and their associated fields is straightforward.
Keywords :
Buffer layers; Electrodes; Electrooptic modulators; Geometrical optics; Optical buffering; Optical modulation; Optical refraction; Optical sensors; Optical variables control; Optical waveguides;
Conference_Titel :
Microwave Conference, 1987. 17th European
Conference_Location :
Rome, Italy
DOI :
10.1109/EUMA.1987.333638
