• DocumentCode
    1998181
  • Title

    Convolutional Coding for SEU mitigation

  • Author

    Frigerio, L. ; Radaelli, M.A. ; Salice, F.

  • Author_Institution
    Dipt. di Elettron. e Inf., Politec. di Milano, Milan
  • fYear
    2008
  • fDate
    25-29 May 2008
  • Firstpage
    191
  • Lastpage
    196
  • Abstract
    Convolutional coding is usually exploited to protect data transmitted over channels, where they are more susceptible to errors. However in recent years, an increasing interest has been drawn to the problem of radiation-induced temporary faults, also called soft errors, which corrupt memory content even during the normal functioning of a system. In this paper, a mitigation technique for the protection of critical data in electronic devices from transient errors that manifest themselves as bit-flips in memory is proposed. In order to cope with this problem we take advantage of convolutional codes and we introduce two architectures to protect memory content with little area and performance overheads. A coding-decoding scheme implemented using sequential logic. The encoding is performed as in classical convolutional encoding, processing the input stream with a shift-register based architecture. The decoder, however, differs from classical decoding schemes in terms of complexity.
  • Keywords
    combinational circuits; convolutional codes; data communication; memory architecture; sequential decoding; shift registers; SEU mitigation; bit-flip; convolutional coding; data transmission; electronic devices; memory content corruption; radiation-induced temporary fault; shift register; soft error; Convolutional codes; Error correction; Fabrication; Maximum likelihood decoding; Memory architecture; Protection; Redundancy; Single event upset; Testing; Threshold voltage; SEU mitigation; convolutional coding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2008 13th European
  • Conference_Location
    Verbania
  • Print_ISBN
    978-0-7695-3150-2
  • Type

    conf

  • DOI
    10.1109/ETS.2008.32
  • Filename
    4556047