• DocumentCode
    1998678
  • Title

    CHiP: A Profiler to Measure the Effect of Cache Contention on Scalability

  • Author

    Brett, B. ; Kumar, Pranaw ; Minjang Kim ; Hyesoon Kim

  • Author_Institution
    Software & Services Group, Intel Corp., Nashua, NH, USA
  • fYear
    2013
  • fDate
    20-24 May 2013
  • Firstpage
    1565
  • Lastpage
    1574
  • Abstract
    Programmers are looking for ways to exploit the multi-core processors which have become commonplace today. One of the options available is to parallelize the existing serial programs using frameworks like OpenMP etc. However, such parallelization does not always yield the speedup expected by the programmer. This is due to various reasons, one of which is the bottleneck presented by the memory system. Carefully optimized serial algorithms fit into most of the cache available, yet these cache optimized serial algorithms might have the worst speedup when parallelized. We present an efficient method to identify such cases and determine whether a serial algorithm´s use of shared memory caches will seriously impact its parallel execution. This can help a programmer adjust their program´s cache usage. We demonstrate the effect in isolation with a parallelized synthetic micro-benchmark which uses varying fractions of the shared cache. We also present the results of our analysis of the NAS Parallel Benchmark suite and the Rodinia benchmark suite.
  • Keywords
    benchmark testing; cache storage; microprocessor chips; shared memory systems; CHiP; NAS parallel benchmark; Rodinia benchmark suite; cache contention; cache optimized serial algorithms; memory system; multicore processors; parallelization; parallelized synthetic micro-benchmark; profiler; shared cache; Arrays; Bandwidth; Benchmark testing; Radiation detectors; Scalability; Semiconductor device measurement; Time measurement; cache; program analysis; scalability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2013 IEEE 27th International
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    978-0-7695-4979-8
  • Type

    conf

  • DOI
    10.1109/IPDPSW.2013.49
  • Filename
    6651053