DocumentCode
2000211
Title
Numerical electronic device modeling for circuit simulators
Author
Yanilmaz, Mehmet ; Eveleigh, Virgil W.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
fYear
1989
fDate
14-16 Aug 1989
Firstpage
1222
Abstract
Static and dynamic numerical device modeling based on dot product evaluation of multidimensional Bernstein polynomial interpolants to evaluate device operating characteristics is presented as an alternative to analytical modeling and table look-up modeling schemes that have been proposed. The model formulation satisfies the requirements imposed by the algebraic-differential equation solution algorithms of most simulators, namely continuity of the output variables and preservation of the monotonicity and concavity or convexity of the data. It is to be noted, however, that those are necessary but not sufficient conditions. Simulator convergence is improved by treating the intrinsic node charges as state variables and using their variations over iteration steps as an iteration criterion along with the node voltage variation checks. MOSFET is taken as a benchmark device. Experimental results to illustrate the effect of the basic premises of the numerical model on simulation performance are presented
Keywords
circuit analysis computing; convergence of numerical methods; insulated gate field effect transistors; iterative methods; polynomials; semiconductor device models; MOSFET; algebraic-differential equation solution algorithms; benchmark device; circuit simulators; convergence; device operating characteristics; dot product evaluation; dynamic modelling; electronic device modeling; intrinsic node charges; iteration criterion; multidimensional Bernstein polynomial interpolants; node voltage variation checks; numerical device modeling; simulation performance; state variables; static modelling; Analytical models; Circuit simulation; Equations; MOSFET circuits; Multidimensional systems; Numerical models; Numerical simulation; Polynomials; Sufficient conditions; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
Conference_Location
Champaign, IL
Type
conf
DOI
10.1109/MWSCAS.1989.102076
Filename
102076
Link To Document