• DocumentCode
    2001579
  • Title

    The measurement of series and shunt resistances of the silicon solar cell based on LabVIEW

  • Author

    Ma, Leikai ; Xu, Liang ; Zhang, Kunpeng ; Wu, Wei ; Ma, Zhongquan

  • Author_Institution
    Dept. of Phys., Shanghai Univ., Shanghai, China
  • fYear
    2011
  • fDate
    16-18 Sept. 2011
  • Firstpage
    2711
  • Lastpage
    2714
  • Abstract
    Based on LabVIEW, the measurement system of I-V characteristics of solar energy is designed with a solar simulator, a Keithley 2400 Source Meter and a GPIB port. The system can quickly describe the I-V characteristic curves and calculate the basic characteristic parameters and focus on the analysis of the series resistance (Rs) and shunt resistance (Rsh). The results of the measurement demonstrate that the system can precisely measure every parameter of the solar cell especially the series resistance (Rs) and shunt resistance (Rsh), which is of commercial value.
  • Keywords
    electric reactance measurement; elemental semiconductors; silicon; solar cells; virtual instrumentation; LabVIEW; series measurement; shunt resistances measurement; silicon solar cell; solar energy; Electrical resistance measurement; Equations; Immune system; Mathematical model; Photovoltaic cells; Resistance; Temperature measurement; I-V characteristic curve; LabVIEW; series resistance; shunt resistance; solar cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Control Engineering (ICECE), 2011 International Conference on
  • Conference_Location
    Yichang
  • Print_ISBN
    978-1-4244-8162-0
  • Type

    conf

  • DOI
    10.1109/ICECENG.2011.6058342
  • Filename
    6058342