DocumentCode
2003635
Title
On the robustness achievable with stochastic development processes
Author
Viswanathan, Shivakumar ; Pollack, Jordan B.
Author_Institution
Dept. of Comput. Sci., Brandeis Univ., Waltham, MA, USA
fYear
2005
fDate
29 June-1 July 2005
Firstpage
34
Lastpage
39
Abstract
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant systems. By treating manufacturing as a stochastic development process, we characterize some of the constraints limiting the levels of robustness that can be achieved with evolution. The analysis is by introducing a novel abstraction of development as a strategic decision-making process. Using this abstraction to analyze a toy-system that simulates a process of noisy assembly, we compare the maximum robustness achievable with adaptive and non-adaptive developmental strategies. Even in this highly simplified setup, the optimal adaptive and non-adaptive genotypes reveals a significant empirical difference in their robustness characteristics. This suggests that the choice of developmental strategy and the properties of the setup are major constraints on the robustness achievable, even prior to evolution-related considerations.
Keywords
adaptive systems; decision making; manufacturing processes; manufacturing systems; stochastic processes; adaptive genotypes; complex hardware system; fault tolerant systems; manufacturing process; manufacturing uncertainty; noisy assembly; nonadaptive genotypes; stochastic development process; strategic decision making; Analytical models; Computer science; Evolution (biology); Fault tolerant systems; Hardware; Manufacturing automation; Manufacturing processes; Robustness; Stochastic processes; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Evolvable Hardware, 2005. Proceedings. 2005 NASA/DoD Conference on
ISSN
1550-6029
Print_ISBN
0-7695-2399-4
Type
conf
DOI
10.1109/EH.2005.38
Filename
1508479
Link To Document