• DocumentCode
    2003635
  • Title

    On the robustness achievable with stochastic development processes

  • Author

    Viswanathan, Shivakumar ; Pollack, Jordan B.

  • Author_Institution
    Dept. of Comput. Sci., Brandeis Univ., Waltham, MA, USA
  • fYear
    2005
  • fDate
    29 June-1 July 2005
  • Firstpage
    34
  • Lastpage
    39
  • Abstract
    Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant systems. By treating manufacturing as a stochastic development process, we characterize some of the constraints limiting the levels of robustness that can be achieved with evolution. The analysis is by introducing a novel abstraction of development as a strategic decision-making process. Using this abstraction to analyze a toy-system that simulates a process of noisy assembly, we compare the maximum robustness achievable with adaptive and non-adaptive developmental strategies. Even in this highly simplified setup, the optimal adaptive and non-adaptive genotypes reveals a significant empirical difference in their robustness characteristics. This suggests that the choice of developmental strategy and the properties of the setup are major constraints on the robustness achievable, even prior to evolution-related considerations.
  • Keywords
    adaptive systems; decision making; manufacturing processes; manufacturing systems; stochastic processes; adaptive genotypes; complex hardware system; fault tolerant systems; manufacturing process; manufacturing uncertainty; noisy assembly; nonadaptive genotypes; stochastic development process; strategic decision making; Analytical models; Computer science; Evolution (biology); Fault tolerant systems; Hardware; Manufacturing automation; Manufacturing processes; Robustness; Stochastic processes; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Evolvable Hardware, 2005. Proceedings. 2005 NASA/DoD Conference on
  • ISSN
    1550-6029
  • Print_ISBN
    0-7695-2399-4
  • Type

    conf

  • DOI
    10.1109/EH.2005.38
  • Filename
    1508479