DocumentCode :
2004637
Title :
Diagnostics and experiments on dielectric properties using Time Domain Reflectometry (TDR)
Author :
Mériem, Abdelguerfi ; Achour, Soualmia ; Chafik, Gherbi
Author_Institution :
Dielectric Spectrosc. Lab., USTHB, Algiers, Algeria
fYear :
2010
fDate :
4-9 July 2010
Firstpage :
1
Lastpage :
4
Abstract :
Basically, behaviour of dielectric materials is experimentally described by the electrical conductivity and the dielectric permittivity measurements over the necessary frequency range from the very low up to the very high frequencies. The whole field of dielectric measurements covers a wide frequency range requiring a large number of tools and laborious frequency domain techniques. This is why, for some decades, Time Domain Reflectometry (TDR) methods have seemed to be the alternative to the point by point approach in the Frequency Domain. The objective of this paper is to present an approach of models describing the polarization mechanisms including dielectric relaxation and electrical conductivity.
Keywords :
dielectric materials; dielectric polarisation; dielectric relaxation; electrical conductivity; frequency-domain analysis; permittivity; time-domain reflectometry; dielectric materials; dielectric permittivity; dielectric properties; dielectric relaxation; electrical conductivity; frequency domain techniques; time domain reflectometry; Conductivity; Dielectric measurements; Dielectrics; Frequency domain analysis; Permittivity; Time domain analysis; Permittivity; conductivity; relaxation; time domain reflectometry(TDR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location :
Potsdam
Print_ISBN :
978-1-4244-7945-0
Electronic_ISBN :
978-1-4244-7943-6
Type :
conf
DOI :
10.1109/ICSD.2010.5568122
Filename :
5568122
Link To Document :
بازگشت