• DocumentCode
    2007637
  • Title

    Average Run Length Performance of Shewhart Control Chart with Interpretation Rules using Markov Chain Approach

  • Author

    Jamali, Abdul Sattar ; Jinlin, Li ; Chandio, Abdul Fattah

  • Author_Institution
    Beijing Inst. of Technol., Beijing
  • fYear
    2007
  • fDate
    May 30 2007-June 1 2007
  • Firstpage
    2055
  • Lastpage
    2059
  • Abstract
    The advantage of a Shewhart X macr control chart is its simplicity and its ability to detect large process average shifts quickly. However, the Shewhart chart, which signals an out-of-control condition when a single point falls beyond a 3-sigma limit, is also known for its insensitivity to small process average shifts. In order to make the Shewhart X macr macr control chart more sensitive for small process average shifts, an additional interpretation rules has been suggested by the practitioners. Therefore, in this paper the average run length (ARL) performance of Shewhart X macr control chart with most interpretation rules used in practice was evaluated using MARKOV chain for normal and gamma distributions through by MATLAB. The results show that the in-control average run length performance (when process is in control) be fairly high for particular rule 3 when underlying data from a gamma distribution rather than normal distribution. It was also observed that the out-of-control average run length performance (when process is out of control) vary greatly from normal to gamma distributions.
  • Keywords
    Markov processes; control charts; gamma distribution; normal distribution; statistical process control; ARL performance; MATLAB; Markov chain approach; Shewhart control chart; average run length performance; gamma distributions; interpretation rules; manufacturing process; normal distributions; process average shifts; statistical process control; Automatic control; Automation; Conference management; Control charts; Engineering management; Gaussian distribution; Manufacturing processes; Process control; Signal processing; Technology management; Markov chain; Shewhart control chart; average run length; gamma distribution; intrepretation rules; normal distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Automation, 2007. ICCA 2007. IEEE International Conference on
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4244-0818-4
  • Electronic_ISBN
    978-1-4244-0818-4
  • Type

    conf

  • DOI
    10.1109/ICCA.2007.4376722
  • Filename
    4376722