DocumentCode
2007884
Title
Toward ultimate performance in GHZ MEMS resonators: Low impedance and high Q
Author
Harrington, B.P. ; Shahmohammadi, M. ; Abdolvand, R.
Author_Institution
Oklahoma State Univ., Tulsa, OK, USA
fYear
2010
fDate
24-28 Jan. 2010
Firstpage
707
Lastpage
710
Abstract
In this paper we report a ~1GHz lateral extensional thin-film piezoelectric-on-substrate (TPoS) resonator with an unloaded quality factor (Q) of 6700 in air (frequency-quality factor product of 6.6Ã1012), a motional impedance of ~160¿, and a linear thermal coefficient of frequency of -29ppm. To achieve such low impedance the 21st harmonic resonance mode of a single crystalline silicon block is excited while the near-resonance spurs are suppressed by rigidly supporting the resonator with multiple anchors. Results measured from identical devices each supported with various anchor designs are compared and the effectiveness of increasing rigidity to remove the near-resonance distortions is confirmed. With the reported performance in this work, the fabricated ~1 GHz resonator is suitable for very low-power and low-noise high-frequency oscillator applications.
Keywords
Q-factor; crystal resonators; micromechanical resonators; thin films; MEMS resonator; TPoS resonator; anchor design; crystalline silicon block; harmonic resonance mode; linear thermal coefficient; motional impedance; near-resonance distortion; quality factor; thin-film piezoelectric-on-substrate resonator; Crystallization; Distortion measurement; Frequency; Impedance; Micromechanical devices; Piezoelectric films; Q factor; Resonance; Silicon; Thermal factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
Conference_Location
Wanchai, Hong Kong
ISSN
1084-6999
Print_ISBN
978-1-4244-5761-8
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2010.5442310
Filename
5442310
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