Coupling Capacitances of Connecting-lead Systems in Integrated Circuits

The development of integrated circuits has reached a situation today that the circuit operating speed is not limited by the parameters of the transistors any more, but rather by the electrical parameters of the interconnections inside the integrated circuit (Kropewnicki, 2002). For this reason, it is necessary to take in account the properties of interconnecting conductors from the start of the circuit design process. Undesirable parasitic electromagnetic couplings appear between the interconnecting lines, causing the transfer of interfering impulses onto the signal-carrying lines. These interfering impulses then result in random errors and/or disturbances in the integrated circuit