DocumentCode
2008580
Title
Thermoelectric properties of the incommensurate layered semiconductor Ge/sub x/NbTe/sub 2/
Author
Snyder, G. JeMey ; Caillat, T. ; Fleurial, J.-P.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
1999
fDate
Aug. 29 1999-Sept. 2 1999
Firstpage
541
Lastpage
545
Abstract
The compounds Ge/sub x/NbTe/sub 2/ (0.39/spl les/x/spl les/0.53) have been studied for their thermoelectric properties. By changing x, the carrier concentration can be adjusted so that the material changes from a p-type metal to a p-type semiconductor. The maximum germanium concentration at about Ge/sub 0.5/NbTe/sub 2/, is also the most semiconducting composition. High and low temperature electrical resistivity, Hall effect, Seebeck coefficient, and thermal conductivity were measured. The thermal conductivity is reasonably low and glasslike with room temperature values around 20-25 mW/cm K. However, the power factor is too low to compete with state of the art materials. The maximum ZT found in these compounds is about 0.12. The low ZT can be traced to the low carrier mobility of about 10 cm/sup 2//Vs. The related compounds Si/sub 0.2/NbTe/sub 2/ and Ge/sub 0.5/TaTe/sub 2/ were also studied.
Keywords
Hall effect; carrier density; electrical resistivity; germanium compounds; niobium compounds; semiconductor materials; thermal conductivity; thermoelectric power; Ge/sub x/NbTe/sub 2/; GeNbTe/sub 2/; Hall effect; Seebeck coefficient; carrier concentration; electrical resistivity; incommensurate layered semiconductor; low carrier mobility; p-type metal; p-type semiconductor; power factor; thermal conductivity; thermoelectric properties; Conducting materials; Electric resistance; Germanium; Hall effect; Inorganic materials; Semiconductivity; Semiconductor materials; Temperature; Thermal conductivity; Thermoelectricity;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 1999. Eighteenth International Conference on
Conference_Location
Baltimore, MD, USA
ISSN
1094-2734
Print_ISBN
0-7803-5451-6
Type
conf
DOI
10.1109/ICT.1999.843447
Filename
843447
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