DocumentCode
2011583
Title
[Front cover]
fYear
2009
fDate
11-12 May 2009
Abstract
The following topics were dealt with: imaging sensors; electrical tomography systems; medical imaging systems; biometrics; tomographic image analysis; millimeter and microwave imaging; calibration techniques; optical imaging; image recognition; feature extraction; industrial tomography imaging and image algorithms.
Keywords
biomedical imaging; biometrics (access control); calibration; electric impedance imaging; feature extraction; image recognition; image sensors; industrial engineering; microwave imaging; millimetre wave imaging; optical images; tomography; biometrics; calibration technique; electrical tomography system; feature extraction; image algorithm; image recognition; imaging sensor; industrial tomography imaging; medical imaging system; microwave imaging; millimeter imaging; optical imaging; tomographic image analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Imaging Systems and Techniques, 2009. IST '09. IEEE International Workshop on
Conference_Location
Shenzhen
Print_ISBN
978-1-4244-3482-4
Type
conf
DOI
10.1109/IST.2009.5071586
Filename
5071586
Link To Document