DocumentCode
2011970
Title
Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637)
fYear
2000
fDate
30-30 April 2000
Abstract
The following topics were covered: deep submicron IDDQ testing; defect-oriented testing; current measurement and yield; current and voltage test techniques
Keywords
CMOS integrated circuits; VLSI; electric current measurement; fault diagnosis; integrated circuit testing; integrated circuit yield; logic testing; voltage measurement; CMOS ICs; IC yield; current measurement; current test techniques; deep submicron IDDQ testing; defect-oriented testing; voltage test techniques;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect Based Testing, 2000. Proceedings. 2000 IEEE International Workshop on
Conference_Location
Montreal, Quebec, Canada
Print_ISBN
0-7695-0637-2
Type
conf
DOI
10.1109/DBT.2000.843682
Filename
843682
Link To Document