• DocumentCode
    2012175
  • Title

    Research and simulation of Volterra series kernel identification on wiener model

  • Author

    Chen, Y. ; Liu, Z.Y. ; Zhang, H.J.

  • Author_Institution
    Zhengzhou Inst. of Aeronaut. Ind. Manage., Zhengzhou, China
  • Volume
    4
  • fYear
    2010
  • fDate
    17-18 July 2010
  • Firstpage
    95
  • Lastpage
    98
  • Abstract
    Non-linear system identification is a hot point problem in the field of electrical information and automatically control. Among many analysis methods, Volterra series model has rigorous theory basic, which can approximate in any precision, and reconstruct non-linear system, so, it has been applied into many non-linear system identification and equipment fault diagnosis. But, with the improvement of memory length and identification degree, Volterra high degree kernel will become complex and hard to identification, and cause reduction of identification precision, even to failure. This paper uses a kind of reproducing kernel Hilbert space method, transfer calculating Volterra series kernel into reproducing kernel or Hilbert space, which can reduce operation amount largely, and can calculate infinite degree Volterra series kernel coefficient in theory. Through simulation to some non-linear system, this solution has higher identification precision, and second amplitude frequency response error is less than 5dB, phase frequency response is less than 3 degree, which proving algorithm´s accuracy.
  • Keywords
    Hilbert spaces; Volterra series; fault diagnosis; identification; nonlinear systems; stochastic processes; Volterra series kernel identification; Wiener model; automatic control; electrical information; equipment fault diagnosis; kernel Hilbert space method; nonlinear system identification; Hilbert space; Volterra series; frequency response; non-linear System identification; reproducing kernel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Science and Information Application Technology (ESIAT), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-7387-8
  • Type

    conf

  • DOI
    10.1109/ESIAT.2010.5568512
  • Filename
    5568512