• DocumentCode
    2012663
  • Title

    Data fusion for electrical spectro-tomography

  • Author

    Nahvi, Manoochehr ; Hoyle, Brian S.

  • Author_Institution
    Sch. of Electron. & Electr. Eng., Univ. of Leeds, Leeds
  • fYear
    2009
  • fDate
    11-12 May 2009
  • Firstpage
    229
  • Lastpage
    234
  • Abstract
    Electrical tomography has demonstrated the fast estimation of spatial distributions in a range of industrial processes, but has limitations in applications which feature multiple components. There is a need to discriminate between such components, or to identify specific materials, while retaining fast performance to permit the tracking of process dynamics. To deliver this need a method is outlined that utilizes a compressed, wideband excitation signal to produce response data. These are then pre-processed into segmented datasets for frequencies of interest, which in turn yield frequency-banded tomograms. These data must be fused to gain process component discrimination or identification and hence deliver the benefits. The paper describes a number of potential data fusion methods: exploiting a look-up table of known process components; and identification via a process model. Simulation based trials are described and their results are presented in overview and evaluated as a key step in the development of spectro-tomography as a new process sensing and measurement method.
  • Keywords
    electric impedance imaging; image fusion; image segmentation; tomography; data fusion; electrical impedance tomography; electrical spectro-tomography; frequency-banded tomogram; industrial process; segmented dataset; spatial distribution; wideband excitation signal; Algorithm design and analysis; Electric variables measurement; Fluid flow measurement; Frequency; Image sampling; Impedance measurement; Process control; Table lookup; Tomography; Wideband; Electrical impedance tomography; electrical spectrotomography; tomography data fusion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques, 2009. IST '09. IEEE International Workshop on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-3482-4
  • Electronic_ISBN
    978-1-4244-3483-1
  • Type

    conf

  • DOI
    10.1109/IST.2009.5071639
  • Filename
    5071639