DocumentCode
2013487
Title
Proceedings 18th IEEE VLSI Test Symposium [front matter]
fYear
2000
fDate
April 30 2000-May 4 2000
Abstract
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
Keywords
VLSI; automatic test pattern generation; boundary scan testing; built-in self test; fault diagnosis; integrated circuit testing; integrated memory circuits; IDDQ test; STIL extension; VLSI test; analog BIST; analog test techniques; crosstalk; defect driven techniques; delay test; design validation; fault tolerance; functional test; high level ATPG; jitter; low power BIST; memory test; microprocessor test; online testing; open defect detection; process drift issues; scan related approaches; system-on-chip test techniques; technology trends; temperature drift; test compaction; test scheduling; verification issues;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location
Montreal, Quebec, Canada
ISSN
1093-0167
Print_ISBN
0-7695-0613-5
Type
conf
DOI
10.1109/VTEST.2000.843818
Filename
843818
Link To Document