• DocumentCode
    2014893
  • Title

    Efficient diagnosis of single/double bridging faults with Delta Iddq probabilistic signatures and Viterbi algorithm

  • Author

    Thibeault, C.

  • Author_Institution
    Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    431
  • Lastpage
    438
  • Abstract
    This paper presents an efficient method to diagnose single and double bridging faults. This method is based on Delta Iddq probabilistic signatures, as well as on the Viterbi algorithm, mainly used in telecommunications systems for error correction. The proposed method is a significant improvement over an existing one, based on maximum likelihood estimation. The (adapted) Viterbi algorithm takes into account useful information not considered previously. Simulation and experimental results are presented to validate the approach
  • Keywords
    CMOS logic circuits; Viterbi detection; automatic testing; circuit simulation; fault diagnosis; integrated circuit testing; logic testing; probability; CMOS; Delta Iddq probabilistic signatures; IC testing; Viterbi algorithm; simulation results; single/double bridging faults; Circuit faults; Circuit testing; Debugging; Error correction; Fault diagnosis; Maximum likelihood estimation; Microelectronics; Robustness; Silicon; Viterbi algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2000. Proceedings. 18th IEEE
  • Conference_Location
    Montreal, Que.
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0613-5
  • Type

    conf

  • DOI
    10.1109/VTEST.2000.843875
  • Filename
    843875