DocumentCode :
2015053
Title :
Author index
fYear :
2000
fDate :
4-4 May 2000
Firstpage :
477
Lastpage :
478
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que., Canada
ISSN :
1093-0167
Print_ISBN :
0-7695-0613-5
Type :
conf
DOI :
10.1109/VTEST.2000.843881
Filename :
843881
Link To Document :
بازگشت