DocumentCode
2015053
Title
Author index
fYear
2000
fDate
4-4 May 2000
Firstpage
477
Lastpage
478
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location
Montreal, Que., Canada
ISSN
1093-0167
Print_ISBN
0-7695-0613-5
Type
conf
DOI
10.1109/VTEST.2000.843881
Filename
843881
Link To Document