DocumentCode
2016999
Title
Handling Persistent States in Process Checkpoint/Restart Mechanisms for HPC Systems
Author
Riteau, Pierre ; Lebre, Adrien ; Morin, Christine
Author_Institution
Centre Rennes - Bretagne Atlantique, INRIA, Rennes
fYear
2009
fDate
18-21 May 2009
Firstpage
404
Lastpage
411
Abstract
Computer clusters are today the reference architecture for high-performance computing. The large number of nodes in these systems induces a high failure rate. This makes fault tolerance mechanisms, e.g. process checkpoint/restart, a required technology to effectively exploit clusters. Most of the process checkpoint/restart implementations only handle volatile states and do not take into account persistent states of applications, which can lead to incoherent application restarts. In this paper, we introduce an efficient persistent state checkpoint/restoration approach that can be interconnected with a large number of file systems. To avoid the performance issues of a stable support relying on synchronous replication mechanisms, we present a failure resilience scheme optimized for such persistent state checkpointing techniques in a distributed environment. First evaluations of our implementation in the kDFS distributed file system show the negligible performance impact of our proposal.
Keywords
file organisation; grid computing; software fault tolerance; software maintenance; HPC systems; computer clusters; failure resilience scheme; fault tolerance mechanisms; high-performance computing; kDFS distributed file system; persistent state checkpointing technique; process checkpoint-restart mechanism; Checkpointing; Computer architecture; Contracts; Fault tolerance; Fault tolerant systems; File systems; Grid computing; Proposals; Registers; Resilience; Distributed architectures; Distributed file systems; High performance; Persistent state checkpointing; Process checkpoint/restart;
fLanguage
English
Publisher
ieee
Conference_Titel
Cluster Computing and the Grid, 2009. CCGRID '09. 9th IEEE/ACM International Symposium on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-3935-5
Electronic_ISBN
978-0-7695-3622-4
Type
conf
DOI
10.1109/CCGRID.2009.29
Filename
5071898
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