DocumentCode
2017072
Title
Block-Level Relaxation for Timing-Robust Asynchronous Circuits Based on Eager Evaluation
Author
Jeong, Cheoljoo ; Nowick, Steven M.
Author_Institution
Dept. of Comput. Sci., Columbia Univ., New York, NY
fYear
2008
fDate
7-10 April 2008
Firstpage
95
Lastpage
104
Abstract
As variability and timing closure become critical challenges in synchronous CAD flows, one attractive alternative is to use robust asynchronous circuits which gracefully accommodate timing discrepancies. In this approach, each gate in an initial Boolean netlist is typically replaced by a robust dual-rail asynchronous template. However, these circuits typically have significant area and latency overhead. A gate-level relaxation approach has recently been proposed: replacing selected simple gates by asynchronous templates performing eager evaluation, without affecting the circuit´s overall timing robustness. In this paper, the approach has been significantly extended to block-level relaxation: handling arbitrarily complex multi-output blocks. For these circuits, a much wider range of optimizations is applicable than in the gate-level approach. A block-level relaxation algorithm is implemented, and experiments performed on several high-speed arithmetic circuits (Brent-Kung and Kogge-Stone adders, combinational multipliers). On average, 38.4% of the blocks could be relaxed (48.4% best-case),with area improvement of 27.2% (49.7% best-case)and delay improvement of 13.1% (25.5% best-case) for the critical path,while still preserving the circuit´s overall timing robustness.
Keywords
Boolean functions; asynchronous circuits; circuit CAD; digital arithmetic; optimisation; relaxation; Boolean netlist; arbitrarily complex multioutput blocks; block-level relaxation algorithm; dual-rail asynchronous template; eager evaluation; gate-level relaxation approach; high-speed arithmetic circuits; synchronous CAD flows; timing discrepancy; timing-robust asynchronous circuits; Asynchronous circuits; Computer science; Delay; Design automation; Energy consumption; Robustness; Temperature; Thin film transistors; Timing; Wire; VLSI; asynchronous circuits; computer-aided design; logic optimization; low power; robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Asynchronous Circuits and Systems, 2008. ASYNC '08. 14th IEEE International Symposium on
Conference_Location
Newcastle upon Tyne
ISSN
1522-8681
Print_ISBN
978-0-7695-3107-6
Type
conf
DOI
10.1109/ASYNC.2008.25
Filename
4557002
Link To Document