• DocumentCode
    2017242
  • Title

    Study of photoelectric spectroselective multichannel photocells for photodetectors based on the bulk integrated p-n junctions

  • Author

    Denisova, Elena A. ; Khainovskii, Vladimir I. ; Uzdovskii, Valerii V.

  • Author_Institution
    Moscow State Inst. of Electron. Technol., Moscow, Russia
  • fYear
    2010
  • fDate
    June 30 2010-July 4 2010
  • Firstpage
    487
  • Lastpage
    492
  • Abstract
    The study of the photoelectrical processes in the photosensitive structures based on multichannel bulk integrated p-n junctions is presented in this paper. The distribution of electrical potential and intensity of the electrical field, as well as absorption of the optical radiation in the spatial charge region (SCR) multichannel bulk integrated structure are considered. The processes of photorelaxation, charge accumulation and spectral characteristics of the photosensitivity in the bulk integrated n- and p- areas in photosensitive structures are studies. The design parameters of semiconductor layers and permissible values of control voltages have been obtained. Noise characteristics and circuit features of the photosensitive cell with bulk integrated p-n junctions are considered.
  • Keywords
    p-n junctions; photodetectors; photoelectric cells; semiconductor device noise; charge accumulation; design parameters; electrical potential distribution; multichannel bulk integrated p-n junctions; noise characteristics; optical radiation absorption; permissible values; photodetectors; photoelectric spectroselective multichannel photocells; photorelaxation; photosensitive structures; semiconductor layers; spatial charge region; Photoelectric processes; photocell; photorelaxation; spectral characteristics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro/Nanotechnologies and Electron Devices (EDM), 2010 International Conference and Seminar on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4244-6626-9
  • Type

    conf

  • DOI
    10.1109/EDM.2010.5568750
  • Filename
    5568750