• DocumentCode
    2018528
  • Title

    Mechanical response of copper nanowires under torsion

  • Author

    He, Liping ; Zhu, Fulong ; Duan, Ke ; Tang, Kai ; Liu, Sheng ; Chen, Yanming

  • Author_Institution
    Institute of Microsystems, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, 1037 Luoyu Road, Wuhan, Hubei province, 430074, China
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    318
  • Lastpage
    322
  • Abstract
    Molecular dynamics simulations are used to investigate mechanical properties of < 1 0 0 >, < 1 1 0 > and < 1 1 1 > oriented copper nanowires under different torsional loading rate and temperature. The embedded-atom potential is employed to describe the interactions between Cu atoms. The effects of loading rates and temperature on the critical angle of Cu are discussed. These results of molecular dynamics simulations about the torsion of copper nanowires show that there is a positive correlation between critical angle and loading rate. On the contrary, during the torsion process of copper nanowires, the critical angle decreases with the increasing of temperature. However, mechanical response of copper nanowires under torsion still has some diversity for different lattice orientations. For different loading rate, the amplitude of critical angle of lattice orientation < 1 1 0 > is much bigger than others. What´s more, lattice orientation < 1 1 1 > has a better temperature stability.
  • Keywords
    Circuit stability; Copper; Electronic circuits; Loading; Stability analysis; Temperature; Thermal stability; Molecular dynamics simulations; different lattice orientation; loading rate; temperature; torsion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236600
  • Filename
    7236600