• DocumentCode
    2018893
  • Title

    Status and Trend of SiC Power Semiconductor Packaging

  • Author

    Wang, Yangang ; Dai, Xiaoping ; Liu, Guoyou ; Wu, Yibo ; Li, Daohui ; Jones, Steve

  • Author_Institution
    Power Semiconductor R&D Centre, Dynex Semiconductor Ltd., Zhuzhou CSR Times Electric Co. Ltd., Doddington Road, Lincoln LN6 3LF, United Kingdom
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    396
  • Lastpage
    402
  • Abstract
    With the superior electrical and thermal properties of wide band gap materials, Silicon Carbide (SiC) devices are capable of working at high power density, high temperature, high frequency, high voltage and high efficiency. Although the substantial investigation on SiC material, device and packaging technologies have been done, there are a series of problems needed to be solved, such as the material quality, cost and packaging for high power density and high temperature. In this work, the status and trend of SiC power device packaging are addressed. A brief review of hybrid and full SiC power module in terms of market prospect, module structure, material and technologies are discussed. Then, the performance and reliability of Si and SiC modules are compared, including the thermal resistance, power loss and power cycling capability etc. finally, the packaging trend of SiC module for high thermal performance, high temperature and high reliability are proposed.
  • Keywords
    Electronic packaging thermal management; Insulated gate bipolar transistors; Multichip modules; Reliability; Silicon; Silicon carbide; Packaging; Performance; Power module; Reliability; SiC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236613
  • Filename
    7236613