Method to increase sampling frequency by merging multiple measurements

The use of transient-based methods in IEDs (Intelligent Electronic Devices) in distribution substations has been very rare. The additional unit cost of an IED due to a higher sampling frequency has been considered too high in comparison with the benefits it can provide. This document describes a method to artificially increase the sampling frequency of the IED´s current and voltage measurements by using lower sampling frequency measurements from multiple IEDs. This method makes it possible to utilize transient-based algorithms in a substation without the need to have devices with high sampling frequency. Also power quality functions benefit from this increase of the sampling frequency.