• DocumentCode
    2023922
  • Title

    IC compatible MEMS technology

  • Author

    Grenier, K. ; Mazenq, L. ; Dubuc, D. ; Bouchriha, F. ; Coccetti, F. ; Ojefors, E. ; Eindberg, P. ; Rydberg, A. ; Berntgen, J. ; Rabe, W.J. ; Sonmez, E. ; Abele, P. ; Schumacher, H. ; Plana, R.

  • Author_Institution
    LAAS-CNRS, Toulouse, France
  • fYear
    2005
  • fDate
    3-4 Oct. 2005
  • Firstpage
    293
  • Lastpage
    296
  • Abstract
    This paper deals with an integrated circuits (ICs) compatible MEMS technology, which is used to elaborate an ultra compact RF communication module centered at 24 GHz. This technology uses conventional equipment and is adequate for millimeter wave applications. A compatibility test protocol has consequently been defined in order to check that each technological step does not degrade the SiGe circuits´ performances. Finally, the realized demonstrator present a total surface of only 9 mm/sup 2/.
  • Keywords
    micromechanical devices; microwave integrated circuits; 24 GHz; IC compatible MEMS technology; compatibility test protocol; integrated circuits; ultra compact RF communication module; Circuit testing; Degradation; Integrated circuit technology; Micromechanical devices; Millimeter wave communication; Millimeter wave integrated circuits; Millimeter wave technology; Protocols; Radio frequency; Radiofrequency integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
  • Conference_Location
    Paris
  • Print_ISBN
    88-902012-0-7
  • Type

    conf

  • Filename
    1637208