• DocumentCode
    2024318
  • Title

    Notes [blank page]

  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    143
  • Lastpage
    144
  • Abstract
    This page or pages intentionally left blank.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-9458-3
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2010.5444300
  • Filename
    5444300