• DocumentCode
    20249
  • Title

    1 Mb 0.41 µm² 2T-2R Cell Nonvolatile TCAM With Two-Bit Encoding and Clocked Self-Referenced Sensing

  • Author

    Jing Li ; Montoye, R.K. ; Ishii, M. ; Chang, Ly-Yu

  • Author_Institution
    IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    49
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    896
  • Lastpage
    907
  • Abstract
    This work demonstrates the first fabricated 1 Mb nonvolatile TCAM using 2-transistor/2-resistive-storage (2T-2R) cells to achieve >10× smaller cell size than SRAM-based TCAMs at the same technology node. The test chip was designed and fabricated in IBM 90 nm CMOS technology and mushroom phase-change memory (PCM) technology. The primary challenge for enabling reliable array operation with such aggressive cell is presented, namely, severely degraded sensing margin due to significantly lower ON/OFF ratio of resistive memories (~102 for PCM) than that of traditional MOSFETs (>105 ). To address this challenge, two enabling techniques were developed and implemented in hardware: 1) two-bit encoding and 2) a clocked self-referenced sensing scheme (CSRSS). In addition, the two-bit encoding can also improve algorithmic mapping by effectively compressing TCAM entries. The 1 Mb chip demonstrates reliable low voltage search operation (VDDmin ~750 mV) and a match delay of 1.9 ns under nominal operating conditions.
  • Keywords
    content-addressable storage; encoding; phase change memories; 2T 2R cell nonvolatile TCAM; CMOS technology; algorithmic mapping; clocked self referenced sensing; phase change memory technology; resistive memories; size 90 nm; time 1.9 ns; two bit encoding; Arrays; Encoding; Microprocessors; Phase change materials; Random access memory; Sensors; Associative computing; encoding; hardware accelerator; intrusion detection; matchline compensation; nonvolatile; packet classification; phase change memory (PCM); search engine; self-referenced sensing; ternary content addressable memory (TCAM);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2292055
  • Filename
    6680770