Title :
Automated nanostructure microscopic image characterization and analysis
Author :
Zeljkovic, Vesna ; Tameze, Claude ; Pochan, Darrin J. ; Yingchao Chen ; Valev, Ventzeslav
Author_Institution :
Sch. of Sci. & Technol., Lincoln Univ., Lincoln, PA, USA
Abstract :
Nanoparticles represent material particles in which one dimension measures ~100 nanometers or less. When processed into nanoparticles, the properties of many conventional organic and inorganic materials change. Since nanoparticles can be made from organic or inorganic substances, they are versatile in potential technological applications, from delicate electronics to revolutionary medical procedures. While an average structure and size is clear from characterization measurements and observations there is always a dispersity in size and shape of the final nanoparticle system. Even though microscopy is an excellent technique in capturing direct images of the nanoparticle morphology, it is difficult to assess the dispersity in size and shape of the nanostructure simply by observation of the microscopy data. This is why we propose a computer-assisted tool developed for the purpose of facilitated nanoparticle detection and its morphology identification.
Keywords :
image processing; materials science computing; nanoparticles; automated nanostructure microscopic image analysis; automated nanostructure microscopic image characterization; computer-assisted tool; image capture; inorganic materials; microscopy data; nanoparticle morphology; nanoparticle system shape; nanoparticle system size; organic materials; technological applications; Electron microscopy; Image edge detection; Morphology; Nanoparticles; Shape; Solvents; automated detcction; digital image processing; nanoparticles; nanotechnology;
Conference_Titel :
High Performance Computing & Simulation (HPCS), 2015 International Conference on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-7812-3
DOI :
10.1109/HPCSim.2015.7237052