Title :
A parallel processing system for measuring 3D surface profile using RF spectrogram
Author :
Hyungtae Kim ; SeungTaek Kim ; Kyungchan Jin
Author_Institution :
Smart Syst. Res. Group, KITECH, CheonAn, South Korea
Abstract :
A scanning system was constructed for detecting 3D profile of a whole body using an RF antenna array and a parallel processing unit. The antenna array generated signals whose information indicated reflection from a target object. The signals in the array were produced during rotation and sampled with triggers by a high speed ADC. The sampled data was transferred to a parallel processing unit. Large number of the triggers and the amount of mathematical computation of frequency analysis forms gigabytes of data size. We showed that the parallel processing unit is useful and time-efficient to detect the 3D profile of whole body by millimeter wave imaging.
Keywords :
analogue-digital conversion; microwave antenna arrays; millimetre wave imaging; parallel processing; radiofrequency spectrometers; surface topography measurement; 3D surface profile measurement; RF antenna array; RF spectrogram; high speed ADC; millimeter wave imaging; parallel processing system; rotation; scanning system; target object reflection; whole body; Antenna arrays; Arrays; Graphics processing units; Imaging; Millimeter wave measurements; Millimeter wave technology; Three-dimensional displays;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-395-1