Title :
Mesoscopic transport characteristics of nano-scale SOI MOSFETs: coulomb blockade and localization
Author :
Omura, Y. ; Yamamoto, M.
Author_Institution :
Hokkaido University
Keywords :
Current measurement; Cyclotrons; Electrons; Interference; MOSFETs; Morphology; Silicon; Temperature measurement; Voltage; Wavelength measurement;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022457
